Student (m/f/d): Development of a Test Stand for Opto-ASIC Modules

Developing a reliable test stand is essential to ensure the correct fabrication of ASICs (Application-Specific Integrated Circuits). In addition to electrical and functional testing of the ASICs, the test stand will include a mechanism for alignment and focusing of the lens integrated into the CoB module. This lens is a crucial part of the optical system, ensuring that incoming light is optimally focused on the sensor’s light-sensitive pixels. Precise lens alignment is therefore critical for achieving high image quality and ensuring the proper functionality of the sensor. As part of this role, you will develop the necessary electronics and mechanics for the test stand, including circuit design for test PCBs (Printed Circuit Boards) and mechanical holders for both the lens and the sensor module. Additionally, you will program and adapt test routines in Python to enable the automated execution of various electrical and functional measurements. You will be able to leverage existing Python scripts and libraries, which are already in use for controlling and evaluating the tests. This position offers an excellent opportunity to gain deep insights into the design and characterization of optoelectronic ASICs. Through hands-on experience with testing methodologies, you will learn about the electronic and functional parameters of an image sensor and expand your practical knowledge in the areas of microelectronics, optical systems, and digital measurement technology.

• Development of a test stand for the electrical and optical characterization of a CMOS Lock-In Pixel image sensor in a CoB module format.
• Design and assembly of test PCBs to enable detailed testing of the sensor's individual functions.
• Integration of an alignment and focusing mechanism for the lens of the sensor module to ensure precise optical imaging.
• Execution of electrical tests, including measuring power consumption, verifying internal Low Dropout Regulators (LDOs), and analyzing Electrostatic Discharge (ESD) protection diodes at the sensor pins.
• Functional testing, such as reading out the Chip ID, performing NAND-Tree tests to verify pad connections, conducting ATPG (Automatic Test Pattern Generation) tests for digital functionality, and characterizing the sensor through test images and dark field measurements.
• Programming and automation of test routines in Python, based on existing scripts and libraries.
• Familiarization with the ASIC architecture and specifications to develop and refine a comprehensive test strategy.